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Atomic Force Microscope(サンプル) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Dec 31, 2025～Jan 27, 2026
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Atomic Force Microscope Product List

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Atomic force microscope

Atomic force microscope

Supports samples up to 100mm square in measurement modes such as C-AFM, KFM, and sMIM.

In addition to functions such as conductive AFM, Kelvin probe force microscopy (KFM), and scanning microwave impedance microscopy (sMIM), it supports samples up to 4 inches. ■ Sample size: Up to 100 mm square ■ Stage travel distance: 100 mm ■ XY scanning range: 100 μm (manufacturing dimensional tolerance +/- 10%) ■ Z scanning range: 9 μm (manufacturing dimensional tolerance +/- 10%) ■ XY scanning resolution: 24-bit control – 0.06 Angstroms ■ Z scanning resolution: 24-bit control – 0.006 Angstroms ■ Noise level: Typ: <0.01 mV RMS

  • Visual Inspection Equipment
  • Atomic Force Microscope

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Compact AFM "NaioAFM" *Demo now available

Compact AFM "NaioAFM" *Demo now available

Quick and simple measurement of surface shapes! Standard features include dust and wind shields, and vibration prevention mechanisms.

The "NaioAFM" is a compact type of atomic force microscope that balances functionality and operability, featuring essential technologies for surface shape measurement as standard, while allowing for easy setup of the device and cantilever replacement. Before scanning, necessary re-tuning, approach to the sample, and tilt correction of the sample plane are automatically performed by the software, so once the cantilever is brought close to the sample, the scan will begin. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera and side-view observation for positioning ■ Additional measurement modes can be added according to needs ■ Demonstrations can be conducted on-site at customer locations *For more details, please refer to the materials. Feel free to contact us with any inquiries. If you wish to request a demonstration, please apply through the contact form.

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  • Electron microscope
  • Atomic Force Microscope

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Custom Atomic Force Microscope (AFM) System

Custom Atomic Force Microscope (AFM) System

We will design and build a customized AFM system tailored to your needs!

It is necessary to conduct AFM measurements, but does the sample require special handling due to its size, or does it require experiments that differ from conventional techniques and methods? We sincerely take your needs into consideration and will work together with you to find solutions. At Japan Quantum Design, we design and build systems tailored to your requirements through close collaboration with the device development team at Nanosurf, the manufacturer based in Switzerland. If you have any concerns or requests regarding surface measurements, please feel free to contact us!

  • Other measurement, recording and measuring instruments
  • Atomic Force Microscope

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Atomic Force Microscope (AFM) "Park NX10"

Atomic Force Microscope (AFM) "Park NX10"

Atomic force microscope providing reliable data with the highest level of nanoscale resolution.

The "Park NX10" is an atomic force microscope (AFM) that can be easily operated at all stages, from sample setup to imaging, measurement, and analysis. With this product, users can focus more on innovative research based on better data and more time. 【Features】 ■ Accurate XY scanning without bowing due to crosstalk removal ■ Accurate AFM topography using a low-noise Z detector ■ Top-class chip lifespan, resolution, and sample protection with true non-contact (TM) mode ■ Nano-order surface analysis of various materials such as semiconductors, polymers, battery materials, and carbon-based materials (see image gallery) *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes
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Atomic Force Microscope (AFM) "Park NX-3DM"

Atomic Force Microscope (AFM) "Park NX-3DM"

Fully automated industrial AFM with NX technology implemented.

The "Park NX-3DM" is a fully automated AFM (Atomic Force Microscope) system designed for overhang profiling, high-resolution sidewall imaging, and critical angle measurement. With its patented separated XY and Z scanning system equipped with an inclined Z scanner, it overcomes the challenges of conventional and flare chip methods in accurate sidewall analysis. 【Essential Tool for Wafer Fabrication】 ■ Fully automated industrial AFM using advanced and precise Park NX technology ■ Tilt head design for undercut and overhang structures ■ Accurate sidewall roughness measurement without the need for sample pretreatment ■ High-quality images can be obtained without damaging the device or sample due to the fully non-contact mode (TM) *For more details, please download the PDF or feel free to contact us.

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Atomic Force Microscope "AFM with Stage"

Atomic Force Microscope "AFM with Stage"

The only microscope capable of non-destructive three-dimensional measurement down to the nanometer scale.

The atomic force microscope "AFM with stage" is the only microscope capable of non-destructive three-dimensional measurements down to the nanometer scale in the atmosphere. It allows measurements without damaging the sample. By using an electromagnetic scanner, stable long-term measurements can be achieved without worrying about non-linear creep or aging effects. With a large stage, it is possible to perform non-destructive measurements simply by setting the sample without cutting the workpiece. Various measurement modes are available, providing functions equivalent to expensive AFM devices. Regardless of the material of the measurement work, measurements at the nano level can be performed immediately, from conductors to insulators, without any coating. For more details, please download the catalog.

  • Electron microscope
  • Atomic Force Microscope

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AFM Atomic Force Microscope Nano Observer 2

AFM Atomic Force Microscope Nano Observer 2

Achieving measurement quality comparable to high-end products from established AFM manufacturers.

Combining flexibility, outstanding performance, and user-friendly operability, it achieves measurement quality comparable to high-end products from established AFM manufacturers. It is equipped with a wide range of functions for nanoscale imaging and characterization. It also enables electrical property measurements (KFM, C-AFM) and features a soft IC mode that can measure fragile samples.

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  • Atomic Force Microscope

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200mm Large Sample Compatible AFM/SPM Jupiter XR

200mm Large Sample Compatible AFM/SPM Jupiter XR

A large sample-compatible stage-type AFM/SPM (Atomic Force Microscope/Scanning Probe Microscope) with excellent resolution, speed, operability, and flexibility.

The Jupiter XR atomic force microscope is the industry's first large sample-compatible AFM/SPM that supports "ultra-high resolution," "high-speed imaging," and "wide-area scanning" with a single scanner without the need to change scanners. The sample stage allows access to the entire 200 mm sample area and inherits the excellent fundamental design and operability developed in the Cypher AFM (released in 2007), as well as the photothermal excitation 'blueDrive.' With its high level of balance, the Jupiter XR is the best choice for applications that require a variety of samples and applications in fields such as analytical science, industrial R&D, and academic research.

  • Microscope
  • Atomic Force Microscope

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Environmentally controlled, ultra-high performance AFM/SPM Cypher ES

Environmentally controlled, ultra-high performance AFM/SPM Cypher ES

A model of the Cypher S, which boasts exceptional performance, with fully equipped enhanced environmental control features. It easily achieves temperature control, gas and liquid measurement, and flow management.

The Cypher ES AFM/SPM (Atomic Force Microscope) from Asylum Research is a model that expands the fully equipped environmental control features on the outstanding Cypher S platform. It maintains the same high resolution, speed, and stability as the Cypher S, while allowing for easy operation in controlled gas or liquid environments and harsh chemical conditions within a temperature range of 0 to 250°C. The Cypher ES is the ultimate AFM designed to meet the most demanding experimental requirements, capable of measurements even in environments that could potentially damage other AFMs. For more details, please contact us or refer to the catalog.

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  • Microscope
  • Atomic Force Microscope

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Atomic Force Microscope 'LiteScope 2.0'

Atomic Force Microscope 'LiteScope 2.0'

Correlation analysis combining SEM and AFM! A deeper understanding of material surfaces.

"LiteScope 2.0" is an atomic force microscope that can be easily integrated with scanning electron microscopes. It can be easily mounted on SEMs and is immediately usable, and it can also be used as a standalone AFM. It is compatible with FIB, GIS, EDS, and other common SEM accessories. 【Features】 ■ Extension of SEM functionality ■ Highly precise correlated imaging ■ Quick and easy alignment to areas of interest ■ Elimination of sample contamination risk ■ Extension of 2D SEM images to 3D *For more details, please refer to the PDF document or feel free to contact us.

  • Electron microscope
  • Other microscopes
  • Other inspection equipment and devices
  • Atomic Force Microscope

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[Analysis Case] AFM Video Observation of Temporal Changes During Heating and Cooling Processes

[Analysis Case] AFM Video Observation of Temporal Changes During Heating and Cooling Processes

Evaluate the shape change of the sample surface in situ.

Polymers can change shape depending on environmental factors such as temperature, humidity, and solvents, and by varying the environmental conditions during evaluation, we can deepen our understanding of their physical properties. In this study, we conducted heating and cooling experiments using polycaprolactone (PCL), which is known for its biodegradability. PCL has a melting point of approximately 60°C, and we continuously observed through video how it changes from a crystalline state to an amorphous state upon heating, and how it recrystallizes upon cooling. Measurement method: AFM Product fields: Biotechnology, Pharmaceuticals, Daily Goods, Food Analysis purpose: Shape evaluation For more details, please download the materials or contact us.

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  • Contract Analysis
  • Contract measurement
  • Atomic Force Microscope

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[New Release!] Atomic Force Microscope 'Park NX7'

[New Release!] Atomic Force Microscope 'Park NX7'

[Japanese Version Catalog Available] New products with low cost, high functionality, and short delivery times! Introducing the atomic force microscopes we handle!

The "Park NX7" is equipped with all the new technologies developed by Park Systems and is available at an affordable price. This product is designed down to the finest details, just like the higher-end models, and can facilitate research. Additionally, it offers flat orthogonal XY scanning without bowing. Please feel free to contact us if you have any inquiries. 【Features】 ■ Highly expandable AFM solution ■ Flat orthogonal XY scanning without bowing ■ Low noise Z detector ■ Improved chip lifespan, sample preservation, and repeatability through True Non Contact mode * You can download the English version of the catalog. * For more details, please refer to the PDF materials or feel free to contact us.

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Low-cost high-performance research AFM/SPM MFP-3D Origin

Low-cost high-performance research AFM/SPM MFP-3D Origin

Achieve high performance and high quality at low cost! The most affordable atomic force microscope with Asylum quality in the low price range. It offers high performance and a wide range of features.

The MFP-3D Origin is a model that features high performance and quality unique to Asylum Research, while being competitively priced against existing low-cost AFM/SPM options. This model offers a balance of performance and price, providing "high-resolution imaging," "large sample handling," "various imaging modes," and "diverse accessories." It is the best entry-level model for starting to use AFM/SPM!

  • Microscope
  • Atomic Force Microscope

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AFM/SPM for Polymers Cypher ES Polymer Edition

AFM/SPM for Polymers Cypher ES Polymer Edition

Standard-equipped with optimal measurement modes and options for polymer material research! Atomic force microscope for polymers based on ultra-high-performance environment-controlled AFM/SPM.

The Cypher ES Polymer Edition is based on the Cypher ES, which adds sophisticated environmental control to Asylum Research's ultra-high-performance AFM, and comes standard with measurement modes and options that are optimal for polymer materials research and polymer characterization (see "Basic Information" below). ● For other features and details, please refer to the catalog or contact us.

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  • Microscope
  • Atomic Force Microscope

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Atomic Force Microscope (AFM) "Park NX-Hivac"

Atomic Force Microscope (AFM) "Park NX-Hivac"

Vacuum environment scanning suitable for fault analysis applications.

The "Park NX-Hivac" is a high vacuum atomic force microscope (AFM) designed for failure analysis and materials that are susceptible to environmental influences. It enables precise failure analysis of highly doped semiconductors. Additionally, by utilizing our already recognized technology, it has achieved low noise measurements with high resolution, high reproducibility, and operability. 【High Vacuum Measurement for Failure Analysis】 - Advanced StepScan automatic mechanism and laser alignment mechanism for high-speed scanning - Multi-sample chuck - Park's unique easy chip exchange function - Large vacuum chamber (300mm×420mm×320mm) - Direct optical microscope that enables ultra-long distance observation - Enhanced sensitivity high vacuum SSRM mode *For more details, please download the PDF or feel free to contact us.

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